Research on Intelligent Diagnosis of Faults in Four-Wire Turnout Control Circuits

Authors

  • Jianhao Xie Guangxi Key Laboratory of International Join for China-ASEAN Comprehensive Transportation, Nanning University, Nanning, 530200, China; Nanning Third Transportation Company, Nanning, 530007, China Author
  • Guoyan Che Guangxi Key Laboratory of Intelligent Transportation System (ITS), Guilin University of Electronic Technology, Guilin, 541004, China Author
  • Jianqiu Chen Guangxi Key Laboratory of International Join for China-ASEAN Comprehensive Transportation, Nanning University, Nanning, 530200, China Author
  • Guobin Gu Guangxi Key Laboratory of International Join for China-ASEAN Comprehensive Transportation, Nanning University, Nanning, 530200, China Author

DOI:

https://doi.org/10.71222/sfdprb17

Keywords:

operating efficienc, track turnout, fault diagnosis, curve similarity

Abstract

This study aims to shorten the troubleshooting time of turnouts in urban rail transit through intelligent diagnosis methods. An intelligent diagnosis system for faults in four-wire turnout control circuits is designed by building an experimental environment, collecting and analyzing data, so as to improve the operating efficiency and safety of trains. The system is developed considering the current reliance on manual inspection in turnout circuit fault diagnosis, which has numerous drawbacks. It consists of multiple functional modules, such as user information management, fault sample data management, and more. By monitoring the action current of turnouts in real-time, it can accurately identify fault types like action circuit short-circuit and switch machine jamming. Through data analysis and comparison, it can precisely locate fault points and provide corresponding maintenance plans. Experimental results have verified its effectiveness in enhancing maintenance efficiency, thus ensuring the stable and safe operation of urban rail transit.

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Published

31 March 2025

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Article

How to Cite

Xie, J., Che, G., Chen, J., & Gu, G. (2025). Research on Intelligent Diagnosis of Faults in Four-Wire Turnout Control Circuits. International Journal of Engineering Advances, 2(1), 59-64. https://doi.org/10.71222/sfdprb17