XIE, Jianhao; CHE, Guoyan; CHEN, Jianqiu; GU, Guobin. Research on Intelligent Diagnosis of Faults in Four-Wire Turnout Control Circuits. International Journal of Engineering Advances, [S. l.], v. 2, n. 1, p. 59–64, 2025. DOI: 10.71222/sfdprb17. Disponível em: https://www.gbspress.com/index.php/IJEA/article/view/213. Acesso em: 4 apr. 2025.